Nicholas Rudawski

FEI Tecnai F20 S/TEM: 2-beam imaging Nicholas Rudawski 11,237 6 лет назад
Underappreciated and Very Useful: The Case for Microprobe-STEM Nicholas Rudawski 1,104 5 месяцев назад
Using Xe+ FIB (PFIB) to prep Mo grids for in-situ lift-outs Nicholas Rudawski 278 5 месяцев назад
FEI Tecnai F20 S/TEM: holder insertion and extraction Nicholas Rudawski 8,036 6 лет назад
FEI Tecnai F20 S/TEM: basic operation in TEM mode Nicholas Rudawski 40,141 6 лет назад
FEI Tecnai F20 S/TEM: STEM mode operation Nicholas Rudawski 13,629 6 лет назад
FEI Themis Z S/TEM: diffraction pattern focusing and stigmating Nicholas Rudawski 741 4 месяца назад
FEI Tecnai F20 S/TEM: convergent beam electron diffraction (CBED) Nicholas Rudawski 6,314 5 лет назад
FEI Tecnai F20 S/TEM: high-resolution (lattice) imaging Nicholas Rudawski 19,604 6 лет назад
SEM-EDS mapping using EDAX Octane Elite EDS and APEX Nicholas Rudawski 42 17 часов назад
An introduction to Cs-corrected S/TEM Nicholas Rudawski 9,721 4 года назад
FEI Tecnai F20 S/TEM: performing EDS (or EDX) in TEM mode Nicholas Rudawski 2,795 6 лет назад
Focused Ion Beam S/TEM Lamella Prep Tutorial Nicholas Rudawski 19,928 5 лет назад
Quantitative S/TEM-EDS Nicholas Rudawski 1,477 1 год назад
FEI Tecnai F20 S/TEM: STEM-EDS Spectrum Imaging Nicholas Rudawski 3,763 6 лет назад
Using the digital camera on your transmission electron microscope Nicholas Rudawski 1,575 5 лет назад
Scanning/Transmission Electron Microscopy: Today's Essential Techniques Nicholas Rudawski 1,473 7 месяцев назад
FEI Tecnai F20 S/TEM: selected area diffraction Nicholas Rudawski 14,044 6 лет назад