FEI Tecnai F20 S/TEM: STEM-EDS Spectrum Imaging

Dr. Nicholas Rudawski of the University of Florida demonstrates use of the FEI Tecnai F20 S/TEM to perform spectrum imaging (also known as element or x-ray mapping) using energy dispersive spectroscopy in STEM mode including:

1. Appropriate instrument configurations for spectrum imaging
2. Choosing settings in TIA for spectrum imaging
3. Collecting a spectrum profile (line scan, or 1D map)
4. Collecting a spectrum image (2D map)
5. Using TIA to generate spectrum profiles and images
6. Using ImageJ to generate composite spectrum images

Тэги:

#Transmission_electron_microscopy #transmission_electron_microscopy #FEI_Tecnai_F20 #Spectrum_Imaging #Energy_Dispersive_Spectroscopy #Elemental_Mapping #Element_Maps #X-ray_maps #Scanning_transmission_electron_microscopy #STEM

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